X-ray investigation of hexagonal crystal structures / De

Продукт No: P2541501

Principle

A polycrystalline zirconium foil is irradiated with X-rays. The resulting Debye-Scherrer reflections are photographed and then evaluated.

Tasks

  1. Take Debye-Scherrer photographs of the zirconium sample.
  2. Evaluate the Debye-Scherrer rings and assign them to the corresponding lattice planes.
  3. Determine the lattice constants of the sample material.
  4. Determine the number of atoms in a unit cell of the sample.

What you can learn about

  • Crystal lattices
  • crystal systems
  • reciprocal lattice
  • Miller indices
  • structure amplitude
  • atomic form factor
  • Bragg scattering



Перечень материалов (вы́писка) Продукт Количество
XR 4.0 expert unit, X-ray unit, 35 kV 09057-99 1
XR 4.0 X-ray Plug-in Mo tube 09057-61 1
XR 4.0 X-ray optical bench 09057-18 1
XR 4.0 X-ray films, 100 pieces 09058-23 1
XR 4.0 X-ray film holder 09057-08 1
XR 4.0 X-ray Diaphragm tube w. zirconium foil 09058-03 1
Slide mount for optical bench expert, h = 30 mm 08286-01 1
XR 4.0 X-ray film developer, for 9 l solution 06696-20 1
XR 4.0 X-ray film fixing, for 9 l solution 06696-30 1
Vernier calliper, plastic 03011-00 1
Tray (PP), 180x240mm, white 47481-00 3

Литература по данной статье

Название Продукт Язык
Handbuch Lehrerversuche mit Röntgenstrahlung für die XR 4.0 expert unit, TESS expert Physik 01200-01 DEU
TESS expert Physics Handbook X-ray Experiments for XR 4.0 expert unit 01200-02 ENG
XRS 4.0 X-ray Strukturanalyse Erweiterungsset 09140-88

Назад к перечню

Продукт No: P2541501

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